首页> 外文会议>Symposium on Organic and Polymeric Materials and Devices―Optical, Electrical and Optoelectronic Properties Apr 1-5, 2002 San Francisco, California, U.S.A. >Structural and Morphological Differences of Thin Films Obtained by Plasma Polymerization of Pyrrole (Ppy) and Thiophene (Pth)
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Structural and Morphological Differences of Thin Films Obtained by Plasma Polymerization of Pyrrole (Ppy) and Thiophene (Pth)

机译:吡咯(Ppy)和噻吩(Pth)的等离子体聚合获得的薄膜的结构和形态差异

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In this work, thin films (thickness~0.5 μm) were obtained by plasma polymerization of pyrrole (Ppy) and thiophene (Pth) at 25-30 W and 0.1-0.2 mbar of pressure. Further doping with iodine was carried out to some of the Ppy and Pth films (Ppy/I_2, Pth/I_2) in order to enhance their electrical conductivity properties. Structural and morphological characterization of both Ppy and Pth as well as of Ppy/I_2 and Pth/I_2 was performed using Infrared Spectroscopy (IR), X-ray Photoelectron Spectroscopy (XPS) and Atomic Force Microscopy (AFM). In the light of the information given by IR, XPS and AFM techniques, exhaustive and accurate description of both undoped and I_2/doped Ppy and Pth films obtained by Plasma Polymerization is attained.
机译:在这项工作中,通过在25-30 W和0.1-0.2 mbar的压力下对吡咯(Ppy)和噻吩(Pth)进行等离子聚合获得了薄膜(厚度〜0.5μm)。为了增强它们的电导率性能,对一些Ppy和Pth膜(Ppy / I_2,Pth / I_2)进行了碘的进一步掺杂。使用红外光谱(IR),X射线光电子能谱(XPS)和原子力显微镜(AFM)对Ppy和Pth以及Ppy / I_2和Pth / I_2进行结构和形态表征。根据IR,XPS和AFM技术提供的信息,可以获得对通过等离子体聚合获得的未掺杂和I_2 /掺杂的Ppy和Pth膜的详尽而准确的描述。

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