【24h】

Magnetic microscopy of Fe/Mn/Fe layers

机译:Fe / Mn / Fe层的电磁显微镜

获取原文
获取原文并翻译 | 示例

摘要

Manganese layers were deposited on polycrystalline Fe-based soft magnetic films.The magnetic domain structure of thin Fe overlayers on top these Mn films was measured by secondary electron microscopy with polarization analysis. The Fe layers show spin polarization only beyond a cartain critical thickness of about 20 A.Beyond this thickness the domain structure of the substrate strts to appear in the Fe overlayer.This delayed onset of ferromagnetic order in the Fe layers is attributed to frustration of ferromagnetic order due to the strong coupling to the antiferromagnetically ordered Mn. With increasing Fe film thickness (between 20-30 A) the magnetization increases and shows the same domain patternas the substrate.We find that for all Mn thicknesses studied (up to 170 A) the Fe overlayer domain structure reproduces the substrate domain structure and the magnetization is always aligned parallel with the substrate magnetization.
机译:在多晶铁基软磁膜上沉积锰层,通过二次电子显微镜和极化分析法测量这些Mn膜顶部的薄铁覆盖层的磁畴结构。 Fe层仅在超过约20 A的临界临界厚度时才会显示自旋极化。超过此厚度时,基底的畴结构会出现在Fe覆盖层中。由于与反铁磁有序的Mn的强耦合而导致有序数。随着Fe膜厚度的增加(在20-30 A之间),磁化强度增加,并显示出与基底相同的畴图案。我们发现,对于所研究的所有Mn厚度(高达170 A),Fe覆层畴结构都可以再现基底畴结构,并且磁化始终与基板磁化平行。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号