Long-Term Cathodoluminescent Characterization of Thin-Film Oxide Phosphors in a Wide Range of Electron Excitation Densities

摘要

Long-term processes of cathodoluminescence degradation of thin film phosphors Zn_2SiO_4:Ti and Zn_2GeO_4:Mn were investigated in a wide range of e-beam energies, current and power densities. The lime dependencies describing the decreasing of emission intensity have been found. At higher current densities of e-beam irradiation, the specific behavior of long-term degradation processes was observed, which is characterized by rapid initial degradation and a slower long term decrease. The most probable mechanisms are proposed for long-term processes of degradation in the investigated phosphors.