Creep mechanisms in a near-gamma TiAl-alloy with duplex microstructure

摘要

In the present work, the creep behavior of a near-gamma TiAl-alloy with duplex microstructure was investigated. In addition to the measurement and evalaution of creep data for component design, special emphasis was given to the microstructural evolution during creep. The following basic processes have been identified as key elements of the overall creep deformation mechanism: (i) ordinary dislocation plasticity, (ii) twinning and (iii) dynamic recrystallization. These processes are coupled and jointly control the creep behavior of the material.