SSO noise and conducted EMI: Modeling, analysis, and design solutions

摘要

Board-level I/Os' signal integrity and conducted EMI have become a critical concern for high-speed circuit designers, and a major cause of performance and reliability degradation of modern electronic systems. In this paper we investigate the impact of simultaneous switching output (SSO) noise, and we propose a methodology for SSO analysis and mitigation based on commercial CAD (Computer-Aided Design) tools that can be seamlessly integrated into an industrial design flow. Experimental results obtained on an automotive microcontroller demonstrate the effectiveness of the proposed approach.