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Measuring apparatus for determinate absorption of the thin-film coatings by the photothermal method

机译:通过光热法确定薄膜涂层吸收的测量装置

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摘要

The optical elements of high-power lasers and lasers systems must have the limiting low absorption so as heat that appears at the absorption produces the thermal deformations of the surfaces of the optical elements; change the spatial, energy and spectral parameters of emission and destruction of the optics.rnThe problems that are connected with production of the high-quality laser optics expect to the creation of the highly sensitive nondestructive testing methods of absorption in the optical elements, to low the absorpton of the thin-film coatings.
机译:大功率激光器和激光器系统的光学元件必须具有有限的低吸收率,以便吸收时出现的热量会引起光学元件表面的热变形;改变光学器件发射,破坏的空间,能量和光谱参数。rn与高品质激光光学器件生产相关的问题在于,希望创造出高度灵敏的光学元件吸收非破坏性测试方法,并将其降低到低水平。薄膜涂层的吸收率。

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  • 来源
  • 会议地点 Nurnberg(DE);Nurnberg(DE)
  • 作者单位

    Department of Photonics, Lviv Polytechnic National University 12 Bandera Str., 79013 Lviv, Ukraine;

    Department of Photonics, Lviv Polytechnic National University 12 Bandera Str., 79013 Lviv, Ukraine;

    Department of Photonics, Lviv Polytechnic National University 12 Bandera Str., 79013 Lviv, Ukraine;

  • 会议组织
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类 TP212;
  • 关键词

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