Within this paper it is shown that the setup that has been developed at the Chair of Manufacturing Technology is enabled for the determination of yield loci of sheet metal at elevated temperatures. Using several optical measurement devices the temperature distributions, the temperature profile during the experiment as well as the distribution of stains are detected without any contact between the measuring tools and the specimen itself. This is the main precondition for avoiding interfering influences on the process of material characterization. Some problems that occurred during the optical strain measurement are solved by additional devices for the setup, so that the process at elevated temperatures is as robust as at room temperature. It is also verified that the distribution of equivalent strain is not affected by the increasing temperature. Therefore, the yield loci that are experimentally determined with this setup represent the real material behavior for various biaxial tensile stress conditions.
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