首页> 外文会议>Royal Microscopical Society Conference, Mar 25-29, 2001, Oxford University >Crystallographic and chemical control of the SEM-EBIC contrast at zinc oxide based varistor grain boundaries
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Crystallographic and chemical control of the SEM-EBIC contrast at zinc oxide based varistor grain boundaries

机译:氧化锌基压敏电阻晶界处SEM-EBIC对比的晶体学和化学控制

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摘要

SEM-EBIC studies have been carried out on two simplified varistor compositions to investigate barrier structures formed at individual grain boundaries. Both resistive and charge separation contrast effects were observed. The strength of the resistive contrast was found to vary with dopant, being stronger in the manganese-doped than in the antimony-doped material. EBIC contrast due to charge separation was observed at some interfaces in both samples. An asymmetry in EBIC contrast was found to be governed by the orientations of the grain boundary planes on either side of the interface.
机译:SEM-EBIC研究已经对两种简化的压敏电阻成分进行了研究,以研究在各个晶界形成的势垒结构。观察到电阻和电荷分离对比效果。发现电阻对比的强度随掺杂剂而变化,掺杂锰的材料比掺杂锑的材料更强。在两个样品的某些界面上均观察到由于电荷分离而产生的EBIC对比。发现在EBIC对比中的不对称性受界面两侧晶界平面的取向支配。

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