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Proposed new damp heat test standards for commercial CIGS modules with bias application or light irradiation

机译:为带有偏置或光照射的商用CIGS模块提议的新湿热测试标准

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摘要

Based on our results that conventional damp-heat (DH) test on a commercial CIGS (a.k.a. CIS, CIGSS) module causes an irreversible "Test-specific" degradation (TSD) that is not observed in modules deployed in fields, we propose a new option for DH testing of CIGS modules. We have tested full-size CIGS modules with/without forward bias, light irradiation and humidity during heat tests. The results clearly show that adding forward bias, or white light irradiation during DH tests suppresses this irreversible degradation. Based on these results, we have proposed to add forward bias and/or light irradiation during DH tests of CIGS modules, to make the test condition closer to real fields and suppress degradations not observed in the field.
机译:根据我们的结果,在商业CIGS(又名CIS,CIGSS)模块上进行常规湿热(DH)测试会导致不可逆的“特定于测试的”退化(TSD),而在现场部署的模块中未发现这种退化,我们提出了一种新方法CIGS模块的DH测试的选项。我们已经在热测试过程中测试了全尺寸CIGS模块的有无正向偏压,光辐射和湿度。结果清楚地表明,在DH测试过程中增加正向偏压或白光照射可以抑制这种不可逆的降解。根据这些结果,我们建议在CIGS模块的DH测试过程中增加正向偏压和/或光照射,以使测试条件更接近真实磁场,并抑制在磁场中未观察到的退化。

著录项

  • 来源
  • 会议地点 San Diego CA(US)
  • 作者单位

    National Institute of Advanced Industrial Science and Technology, AIST #2-20273080, 1-1-1 Umezono, Tsukuba, Ibaraki 305-8568, Japan;

    Solar Frontier K. K., 123-1 Shimokawairi, Atsugi,Kanagawa 243-0206, Japan;

    National Institute of Advanced Industrial Science and Technology, AIST #2-20273080, 1-1-1 Umezono, Tsukuba, Ibaraki 305-8568, Japan;

    Solar Frontier K. K., 123-1 Shimokawairi, Atsugi,Kanagawa 243-0206, Japan;

    National Institute of Advanced Industrial Science and Technology, AIST #2-20273080, 1-1-1 Umezono, Tsukuba, Ibaraki 305-8568, Japan;

    Solar Frontier K. K., 123-1 Shimokawairi, Atsugi,Kanagawa 243-0206, Japan;

    National Institute of Advanced Industrial Science and Technology, AIST #2-20273080, 1-1-1 Umezono, Tsukuba, Ibaraki 305-8568, Japan;

  • 会议组织
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    CIGS; CIS; Test-specific degradation; TSD;

    机译:CIGS;独联体;测试特定的降级; TSD;

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