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High-performance solar-blind AlGaN photodetectors

机译:高性能日盲AlGaN光电探测器

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Design, fabrication, and characterization of high-performance Al_xGa_(1-x)N-based photodetectors i'or solar-blind applications are reported. Al_xGa_(1-x)N heterostructures were designed for Schottky, p-i-n, and metal-semiconductor-metal (MSM) photodiodes. The solar-blind photodiode samples were fabricated using a microwave compatible fabrication process. The resulting devices exhibited extremely low dark currents. Below 3 fA leakage currents at 6 V and 12 V reverse bias were measured on p-i-n and Schottky photodiode samples respectively. The excellent current-voltage (I-V) characteristics led to a detectivity performance of 4.9x10~(14) cmHz~(1/2)W~(-1). The MSM devices exhibited photoconductive gain, while Schottky and p-i-n samples displayed 0.15 AAV and 0.11 AAV peak responsivity values at 267 nm and 261 nm respectively. All samples displayed true solar-blind response with cut-off wavelengths smaller than 280 nm. A visible rejection of 4x10~4 was achieved with Schottky detector samples. High speed measurements at 267 nm resulted in fast pulse responses with >GHz bandwidths. The fastest devices were MSM photodiodes with a maximum 3-dB band width of 5.4 GHz.
机译:报道了基于高性能Al_xGa_(1-x)N的光电探测器或日盲应用的设计,制造和表征。 Al_xGa_(1-x)N异质结构设计用于肖特基,p-i-n和金属-半导体-金属(MSM)光电二极管。使用微波兼容的制造工艺来制造日盲光电二极管样品。所得器件显示出极低的暗电流。在p-i-n和肖特基光电二极管样品上分别测量了在6 V和12 V反向偏置下低于3 fA的泄漏电流。出色的电流-电压(I-V)特性导致了4.9x10〜(14)cmHz〜(1/2)W〜(-1)的探测性能。 MSM器件显示出光电导增益,而肖特基和p-i-n样品分别在267 nm和261 nm处显示0.15 AAV和0.11 AAV峰值响应度值。所有样品均显示真正的日盲响应,且截止波长小于280 nm。肖特基探测器样品实现了4x10〜4的可见抑制。在267 nm处进行高速测量可产生具有> GHz带宽的快速脉冲响应。最快的设备是MSM光电二极管,其最大3-dB带宽为5.4 GHz。

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