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A DFT Study for the Durability of Perfluorosulfonic Acid Membrane

机译:DFT研究全氟磺酸膜的耐久性

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摘要

Durability of perfluorosulfonic acid (PFSA) membrane is an important factor to improve the lifetime of PEFC. In this study the bond dissociation energy of PFSA molecule was investigated by quantum chemistry method to provide basic information for designing more durable PFSA membrane. Nafion? was used as a PFSA molecule. All calculations were performed by Dmol~3. Chemical bond strengths of PFSA molecule were analyzed exhaustively. The vulnerable bond was identified by comparing the results. The same calculations were performed for ionized PFSA molecule to find out the influence of the ionization state on the bond strength. Moreover, the possibility for improving durability of PFSA membrane was investigated by substituting H atoms or CH_3 groups for a part of F atoms.
机译:全氟磺酸(PFSA)膜的耐用性是延长PEFC寿命的重要因素。本研究通过量子化学方法研究了PFSA分子的键解离能,为设计更耐用的PFSA膜提供了基础信息。 Nafion?被用作PFSA分子。所有计算均通过Dmol〜3进行。详尽分析了PFSA分子的化学键强度。通过比较结果确定了脆弱的联系。对离子化的PFSA分子进行了相同的计算,以找出离子化状态对键强度的影响。此外,通过用H原子或CH_3基团代替部分F原子,研究了提高PFSA膜耐久性的可能性。

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  • 来源
  • 会议地点 Vienna(AT);Vienna(AT);Vienna(AT)
  • 作者单位

    Institute of Fluid Science, Tohoku University, Sendai 980-8577, Japan;

    Institute of Fluid Science, Tohoku University, Sendai 980-8577, Japan;

    rnINAMORI Frontier Research Center, Kyushu University, Fukuoka 819-0395, Japan;

    INAMORI Frontier Research Center, Kyushu University, Fukuoka 819-0395, Japan;

    rnGraduate School of Engineering, Tohoku University, Sendai 980-8579, Japan New Industry Creation Hatchery Center, Tohoku University, Sendai 980-8579, Japan;

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  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类 化学电源、电池、燃料电池;
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