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Finite Element Method Simulation of Photoinductive Imaging for Cracks

机译:裂纹光感应成像的有限元模拟

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In this paper, the numerical simulations of photoinductive imaging (PI) method have been performed using the finite element method (FEM) with the 2D transient to characterize corner cracks at the edge of a bolt hole. The PI imaging results have higher spatial resolution in the area of the defect in 2D models as compared with the conventional eddy current (EC) images. The FEM simulation results of 0.5-mm rectangular defects are showed and analyzed. The dependencies of PI signals on EC frequencies and temperature of the thermal spot are also examined. The results demonstrate that the PI method is applicable to examine the geometric shape of corner cracks.
机译:在本文中,使用有限元方法(FEM)对二维瞬态进行了光感应成像(PI)方法的数值模拟,以表征螺栓孔边缘的拐角裂纹。与常规涡流(EC)图像相比,PI成像结果在2D模型中的缺陷区域具有更高的空间分辨率。显示并分析了0.5mm矩形缺陷的有限元模拟结果。还检查了PI信号对EC频率和热点温度的依赖性。结果表明,PI方法适用于检查拐角裂纹的几何形状。

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