The paper presents some of the scientific objectives and the achievements of the FP6/IST European research project entitled "Chameleon RF-Comprehensive High-Accuracy Modeling of effectromagnetic effects in complete Nanoscale RF blocks". One of the project's goals is the development of a better effectronic Design Automation-EDA tool dedicated to the signal integrity design verification of passive nano-structures, including interconnects on RFICs. The major contribution of the article is the new, effective methodology for extraction of the parametric models for passive integrated components with field effects, valid for high frequency broad range. The proposed numeric method is systematically based on a dual approach, which provides two complementary approximations of the exact solution. Duality is applied both to the spaces where the discrete solution is found as well as to the open boundary conditions. Adjoint Field Technique-AFT applied to Finite Integral Techniques is used to handle the parameter variability. The new method decreases the necessary computing resources for modeling, comparing with the usual numerical methods. Considering the variability specific to the nowadays nanotechnologies, the fast extraction of parametric models is a must for the present VLSI and RF-IC design environments.
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