首页> 外文会议>Proceedings of 11th International Bhurban Conference on Applied Sciences amp; Technology >Switching behavior of RF-LDMOS for class-F power amplifier in TCAD
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Switching behavior of RF-LDMOS for class-F power amplifier in TCAD

机译:TCAD中F类功率放大器的RF-LDMOS开关行为

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Nowadays the characterization of RF devices under large signal is performed in TCAD by using computational load-pull (CLP) simulation technique. In this paper, we modified the CLP simulation technique further to study the switching response of RF-LDMOS transistor for high efficiency switching power amplifier (e.g. class-F). In class-F PA operation, we achieved 85 % power added efficiency (PAE) together with 1.0 W/mm RF power density on the basis of finite harmonics. By this CLP technique, we can study the switching response of intrinsic RF-devices directly under large signal operation prior to fabrication or non-linear model of RF-transistor without including any external lumped matching networks.
机译:如今,通过使用计算负载-牵引(CLP)仿真技术,可以在TCAD中对大信号下的RF设备进行表征。在本文中,我们进一步修改了CLP仿真技术,以研究用于高效开关功率放大器(例如F类)的RF-LDMOS晶体管的开关响应。在F级PA操作中,基于有限谐波,我们实现了85%的功率附加效率(PAE)和1.0 W / mm的RF功率密度。通过这种CLP技术,我们可以在RF晶体管的制造或非线性模型之前直接研究大信号操作下固有RF设备的开关响应,而无需包括任何外部集总匹配网络。

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