Investigations of Irradiation Effects on Electronic Components to be used in VUV-FEL and X-FEL Facilities at DESY

摘要

Electronic components during High Energy Physics experiments are exposed to high level of radiation. Radiation environment causes many problems to electronic devices. The goal of several experiments done at DESY (Deutsches Elektronen Synchrotron, Hamburg) was to investigate nature of irradiation effects, caused damages and possible techniques of mitigation. One of aspects of experiments is radiation measurements. The propositions of building radiation monitoring system, using different semiconductor components, are presented. Second aspect is radiation tolerance. Different electronic devices were tested: FPGA chips, CCD sensors, bubble dosimeters and LED diodes. Components were irradiated in TESLA Test Facility 2 tunnel and in laboratory using ~(241)Am/Be neutron source. The results of experiments are included and discussed.