Combined-HIL – integrating HIL and AHIL

摘要

In the process of developing power-electronic systems safe test procedures are crucial: Before connectingrnthe power-electronic system and its load, Hardware-in-the-Loop (HIL) equipment verifies properrnfunction of the control. Modern HIL systems are digital systems - introducing a non-negligible delayrnbased on the duration of their main loop.rnThis disadvantage is solved by the concept of Advanced Hardware-in-the-Loop (AHIL), where switchingrninstants and associated switching states are transferred digitally to the from the control to the AHIL. Thisrnremoves the delay and considerably increases the precision of simulation. The disadvantage of AHIL isrnthat the modulator and the switching-signal generator of the control is no longer tested.rnIntegrating a special switching signal analysis into the AHIL system – knowing in advance switchingrninstants and switching states – removes the disadvantage of AHIL completely. Moreover, a detailedrnanalysis of modulator and switching signal generator becomes available. In this way, error detection andrninformation for debugging are considerably improved even in comparison to known HIL strategies. Thisrnnew concept is named Combined Hardware-in-the-Loop, CHIL.