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Inversion channel detection circuits for optoelectronic interconnect

机译:光电互连的反向通道检测电路

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摘要

Abstract: The inversion channel technology is a new approach to monolithic optoelectronic integration that offers the possibility of FET logic, optical detection, and laser emission from a single chip. The detection is performed by the three terminal configuration of the DOES biased in the off state. Incident light switches the DOES into the on state and recovery from the on state is provided by the conduction of electrons from the inversion channel through a FET connected to the third terminal. In this paper we demonstrate the functionality of this operation with an OEIC that integrates the three terminal DOES device with four FETs. The operation is discussed both as an optical clock and as an electrically clocked optical gate. Sensitivity issues are considered. !13
机译:摘要:反向通道技术是单片光电集成的一种新方法,它提供了从单个芯片进行FET逻辑,光学检测和激光发射的可能性。通过偏置在关闭状态的DOES的三端子配置来执行检测。入射光将DOES切换为导通状态,并且通过连接到第三端的FET从反相沟道传输电子来提供从导通状态的恢复。在本文中,我们通过OEIC演示了此操作的功能,该OEIC将三个终端DOES器件与四个FET集成在一起。该操作既可以作为光时钟也可以作为电时钟光门来讨论。考虑灵敏度问题。 !13

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