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A SIFT feature based registration algorithm in automatic seal verification

机译:自动封印验证中基于SIFT特征的注册算法

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摘要

A SIFT (Scale Invariant Feature Transform) feature based registration algorithm is presented to prepare for the seal verification, especially for the verification of high quality counterfeit sample seal. The similarities and the spatial relationships between the matched SIFT features are combined for the registration. SIFT features extracted from the binary model seal and sample seal images are matched according to their similarities. The matching rate is used to define the similar sample seal that is similar with its model seal. For the similar sample seal, the false matches are eliminated according to the position relationship. Then the homography between model seal and sample seal is constructed and named Hs . The theoretical homography is named H . The accuracy of registration is evaluated by the Frobenius norm of H-Hs . In experiments, translation, filling and rotation transformations are applied to seals with different shapes, stroke number and structures. After registering the transformed seals and their model seals, the maximum value of the Frobenius norm of their H-Hs is not more than 0.03. The results prove that this algorithm can accomplish accurate registration, which is invariant to translation, filling, and rotation transformation, and there is no limit to the seal shapes, stroke number and structures.
机译:提出了一种基于尺度不变特征变换(SIFT)特征的配准算法,为印章验证,特别是对高质量假冒伪劣印章的验证作准备。匹配的SIFT特征之间的相似性和空间关系被组合用于配准。从二元模型图章和样本图章图像中提取的SIFT特征根据它们的相似性进行匹配。匹配率用于定义与其模型密封相似的相似样品密封。对于类似的样品密封件,根据位置关系消除了错误匹配。然后建立模型密封与样品密封之间的单应性,命名为Hs。理论单应性命名为H。配准的准确性由H-Hs的Frobenius规范评估。在实验中,将平移,填充和旋转转换应用于具有不同形状,行程数和结构的密封件。记录变换的图章及其模型图章后,其H-H的Frobenius范数的最大值不超过0.03。实验结果表明,该算法可以实现准确的配准,对平移,填充和旋转变换均具有不变性,并且对密封件的形状,行程数和结构没有限制。

著录项

  • 来源
    《Optoelectronic imaging and multimedia technology II》|2012年|85581R.1-85581R.10|共10页
  • 会议地点 Beijing(CN)
  • 作者单位

    College of Electronic Engineering, Tianjin University of Technology and Education, Tianjin, China 300222;

    College of Electronic Engineering, Tianjin University of Technology and Education, Tianjin, China 300222;

    College of Precision Instrument and Opto-Electronics Engineering, Tianjin University, Tianjin, China 300072;

    College of Precision Instrument and Opto-Electronics Engineering, Tianjin University, Tianjin, China 300072;

  • 会议组织
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    registration; seal imprints; SIFT; homography; verification;

    机译:注册;印章印记;筛;单应性验证;

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