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Masked Detection of Structured Illumination (MDSI): Depth Sensitive Fluorescence Measurement

机译:掩蔽式结构照明检测(MDSI):深度敏感荧光测量

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Current methodologies for obtaining depth-sensitive contrast information from an optically diffusive medium involve complex hardware and software implementations. In turn, such methods typically lead to long acquisition and long reconstruction times, rendering them impractical for real-time use. In this work, we report preliminary proof-of-concept for a hardware-only method capable of providing depth sensitive contrast information without requiring post-acquisition image reconstruction and with rapid acquisition. This method, termed Masked Detection of Structured Illumination (MDSI), relies on physically masking, in the detection arm, the point spread function from a collimated beam illuminating a diffusive medium, to isolate the contribution of the photon path lengths of interest. By continuously scanning and integrating the obtained images, MDSI allows, for the first time, optical depth sectioning of a diffusive medium without any processing.
机译:从光学扩散介质获得深度敏感对比度信息的当前方法涉及复杂的硬件和软件实现。继而,此类方法通常导致较长的获取时间和较长的重建时间,从而使其不适用于实时使用。在这项工作中,我们报告了仅硬件方法的初步概念验证,该方法能够提供深度敏感的对比度信息,而无需采集后图像重建并且具有快速采集功能。这种称为结构化照明的掩盖检测(MDSI)的方法依赖于在检测臂中物理掩盖照射照明扩散介质的准直光束的点扩散函数,以隔离感兴趣的光子路径长度的影响。通过连续扫描和积分所获得的图像,MDSI首次无需任何处理即可对扩散介质进行光学深度切片。

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