State Key Laboratory of Electronic Thin Films and Integrated Devices, School of Optoelectronic Information, University of Electronic Science and Technology of China, Chengdu 610054, P. R. China;
State Key Laboratory of Electronic Thin Films and Integrated Devices, School of Optoelectronic Information, University of Electronic Science and Technology of China, Chengdu 610054, P. R. China;
State Key Laboratory of Electronic Thin Films and Integrated Devices, School of Optoelectronic Information, University of Electronic Science and Technology of China, Chengdu 610054, P. R. China;
State Key Laboratory of Electronic Thin Films and Integrated Devices, School of Optoelectronic Information, University of Electronic Science and Technology of China, Chengdu 610054, P. R. China;
State Key Laboratory of Electronic Thin Films and Integrated Devices, School of Optoelectronic Information, University of Electronic Science and Technology of China, Chengdu 610054, P. R. China;
3D surface measurement; fringe reflection; color fringe pattern; single-shot measurement;
机译:基于彩色条纹图案投影的复杂形状和颜色分布的物体表面的三维测量
机译:基于颜色编码条纹反射技术的动态镜面测量
机译:通过基于相位计算的条纹投影技术回顾单次3D形状测量
机译:利用条纹投影技术和条纹反射技术测量部分漫反射和镜面反射表面的三维形状的研究
机译:基于数字条纹投影和相移技术的三维形状测量。
机译:使用相位测量偏转法对镜面物体进行三维形状测量
机译:基于彩色条纹图案投影的复杂形状和颜色分布的物体表面的三维测量