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Single-shot three-dimensional shape measurement of specular surfaces by orthogonal color fringe pattern reflection technique

机译:正交彩色条纹图案反射技术对镜面的单次三维形状测量

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摘要

A convenient method based on fringe reflection technique with a single color fringe pattern is presented in this paper for dynamic measurements. A color screen and a color CCD camera are required in the system. The orthogonal color fringe pattern, which is composed with a horizontal fringe pattern in the red channel and a vertical fringe pattern in the blue channel, is displayed by the screen. The CCD camera captures the distorted color fringe pattern via the tested specular surface. The horizontal and vertical fringe patterns will be distinguished directly once the composite color fringe pattern is read by the software like MATLAB. After we get the phase of the horizontal and vertical fringe patterns by Fourier transform profilometry, the two directions' slope distributions of the tested specular surface can be acquired by the slope-phase relation of fringe reflection technique, and the shape can be reconstructed by intergral of the slope. The whole shape measurement can be completed by a single fringe pattern. The experiment of measuring a plane mirror shows the phase error of the presented method is several times smaller than the existing method, and a vibrating wafer measuring experiment proves the ability of the proposed method to reach dynamic measurement.
机译:本文提出了一种基于条纹反射技术的单色条纹图案的便捷方法,用于动态测量。系统中需要彩色屏幕和彩色CCD摄像机。屏幕上显示由红色通道中的水平条纹图案和蓝色通道中的垂直条纹图案组成的正交彩色条纹图案。 CCD相机通过经过测试的镜面表面捕获扭曲的色带图案。一旦像MATLAB这样的软件读取了复合色条纹图案,就可以直接区分水平和垂直条纹图案。在通过傅立叶变换轮廓仪获得水平和垂直条纹图案的相位之后,可以通过条纹反射技术的斜率-相位关系来获得被测镜面的两个方向的斜率分布,并且可以通过积分来重建形状的坡度。整个形状的测量可以通过单个条纹图案完成。测量平面镜的实验表明,该方法的相位误差比现有方法小几倍,而振动晶片测量实验证明了该方法能够进行动态测量。

著录项

  • 来源
  • 会议地点 Beijing(CN)
  • 作者单位

    State Key Laboratory of Electronic Thin Films and Integrated Devices, School of Optoelectronic Information, University of Electronic Science and Technology of China, Chengdu 610054, P. R. China;

    State Key Laboratory of Electronic Thin Films and Integrated Devices, School of Optoelectronic Information, University of Electronic Science and Technology of China, Chengdu 610054, P. R. China;

    State Key Laboratory of Electronic Thin Films and Integrated Devices, School of Optoelectronic Information, University of Electronic Science and Technology of China, Chengdu 610054, P. R. China;

    State Key Laboratory of Electronic Thin Films and Integrated Devices, School of Optoelectronic Information, University of Electronic Science and Technology of China, Chengdu 610054, P. R. China;

    State Key Laboratory of Electronic Thin Films and Integrated Devices, School of Optoelectronic Information, University of Electronic Science and Technology of China, Chengdu 610054, P. R. China;

  • 会议组织
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    3D surface measurement; fringe reflection; color fringe pattern; single-shot measurement;

    机译:3D表面测量;边缘反射彩色条纹图案;单次测量;
  • 入库时间 2022-08-26 13:44:43

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