Extraction of optical properties in the sub-diffuse regime by spatially resolved reflectance spectroscopy

摘要

In this paper, the commonly used inverse Monte Carlo model based on absorption and reduced scattering coefficients is extended by a well-known similarity parameter γ (gamma), which carries additional information on the phase function. Sub-diffuse reflectance measurements at five source-detector separations were used to extract the absorption and reduced scattering coefficients and phase function information encapsulated in γ. The performance of the extended inverse Monte Carlo model was evaluated by simulated and experimental reflectance spectra of turbid phantoms. A three-fold increase in the accuracy of the extended inverse Monte Carlo model that incorporates γ was observed.