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Wave front related surface form tolerances for manufacturing higher grade optical components

机译:与波前相关的表面形状公差,用于制造更高等级的光学组件

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For about 200 years surface shape specification for optical components always had one goal only, to make an individual optical component comparable with other pieces of the same type. If the specification is met, the component should fulfill the requested behavior in the related optical system. Nomenclature of specification did not differ in dependence on the components different position in the system or on different used beam diameters vs. components clear aperture. With increasing performance of designed optical systems, surface shape tolerances of components became tighter more and more. Such requirements either lead to inadequate expenses or to the absence of equipment to manufacture and test them in a controlled process.rnBut in reality, only a small part of optical system components are used as they are measured - within full clear aperture. Moreover, the light beam has a significant smaller diameter than the clear aperture has. Typically, this kind of components we find in scanning systems and lenses with large Field of View (FOV).rnAs far as designed surface shape tolerances are derived from maximal acceptable wave front deviation for individual light beams passing through the system, the related method for optical components acceptance test procedures is to analyze wave front deviation in sub apertures caused by surface shape deviation. In this case designed values and manufactured results are comparable to each other. To get the comparable values, surface shape analysis must be done in a gliding sub-aperture area instead of analysing full clear aperture.rnWe show how sophisticated optical systems components may be specified, manufactured and tested in gliding sub-aperture areas for any term described in normative papers, such as ISO 10110-Part 5 "Surface Form Tolerances", to assure the final function in system. The chosen examples correspond with "classic specified" optical component surface shapes down to 3/-(0.02)@546nm.
机译:在大约200年的时间里,光学组件的表面形状规范始终仅具有一个目标,即使单个光学组件可与相同类型的其他零件相媲美。如果符合规格,则组件应在相关的光学系统中满足要求的行为。规范的命名没有变化,取决于组件在系统中的不同位置或取决于使用的不同光束直径与组件的透明孔径。随着设计的光学系统性能的提高,组件的表面形状公差变得越来越严格。这样的要求要么导致支出不足,要么导致缺少用于在受控过程中进行制造和测试的设备。但是,实际上,在测量光学系统组件时,只有一小部分使用了该组件-在完全透明的孔径内。此外,光束的直径明显小于透明孔的直径。通常,在扫描系统和具有大视场(FOV)的镜头中会发现这种组件。rn就设计的表面形状公差是根据穿过系统的单个光束的最大可接受波前偏差得出的,相关的测量方法光学元件验收测试程序是分析由表面形状偏差引起的子孔径中的波前偏差。在这种情况下,设计值和制造结果可相互比较。为了获得可比的值,必须在滑动子孔径区域中进行表面形状分析,而不是分析完整的通光孔径。rn我们展示了如何针对所描述的任何术语在滑动子孔径区域中指定,制造和测试复杂的光学系统组件在规范性文件中,例如ISO 10110-Part 5“表面形状公差”,以确保系统中的最终功能。所选示例与“经典指定”光学组件表面形状低至3/-(0.02)@546nm相对应。

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