Wave-front aberrations analysis by Zernike polynomials based on the annular sub-aperture stitching system

摘要

Annular sub-aperture stitching method was developed for testing large-aperture aspheric surfaces without using of any compensating element for measurement. It is necessary to correct measurement of aspheric optical aberrations and create mathematical description to describe wave-front aberrations. Zernike polynomials are suitable to describe wave aberration functions and data fitting of experimental measurements for the annular sub-aperture stitching system. This paper uses Zernike polynomials to describe the wave-front aberrations of full wave-front and reconstructed wave-front by annular sub-aperture stitching algorithm. At the same time, the imaging quality of the aspheric optical element can be contrasted. The stitching result shows good agreement with the full aperture result.