Modelled and experimental laser-induced sensor damage thresholds to continuous wave infrared sources

摘要

The laser-induced damage thresholds of commercial off-the-shelf visible and shortwave infrared cameras are measured under laboratory and outdoor conditions for infrared laser exposure times varying from microseconds to continuous wave. The damage threshold results are compared with a simple thermal model, which shows strong correlation with the experimental data, allowing the model to be used to predict camera damage thresholds across a range of exposure durations and wavelengths.