首页> 外文会议>MEMS-vol.6; ASME International Mechanical Engineering Congress and Exposition; 20041113-19; Anaheim,CA(US) >IMPROVEMENT AND EVALUATION OF METAL THIN FILMS BY VERY LOW ENERGY ARGON ION IRRADIATION
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IMPROVEMENT AND EVALUATION OF METAL THIN FILMS BY VERY LOW ENERGY ARGON ION IRRADIATION

机译:极低能氩离子辐照对金属薄膜的改进和评价

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A new methodology using very low energy Ar ion irradiation is proposed to improve the mechanical properties of thin metal films deposited by sputtering. In this study, accelerating voltage of Ar ion plasma was set to lower than 100V, and several conditions were applied to irradiations. Consequently, it is found that Young's modulus and hardness of Aluminum and Nickel thin film increases about 10% by the irradiation compared with a non-irradiated thin film. (111)― oriented integrated intensity of diffraction of Al and Ni thin film was increased by the irradiation. It is considered that crystalline orientation was changed and column spacing of the film be filled by the irradiation. It is shown that the proposed technique is effective to improve the mechanical properties of metal thin films with proper irradiation conditions.
机译:提出了一种使用非常低能量的Ar离子辐照的新方法,以改善通过溅射沉积的金属薄膜的机械性能。在这项研究中,将Ar离子等离子体的加速电压设置为低于100V,并对照射施加了几种条件。因此,发现铝和镍薄膜的杨氏模量和硬度通过辐照与未辐照的薄膜相比增加了约10%。 (111)-通过辐照提高了Al和Ni薄膜的取向积分衍射强度。认为改变了晶体取向并且通过照射填充了膜的列间距。结果表明,所提出的技术在适当的辐照条件下能有效提高金属薄膜的力学性能。

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