Defect Classification for Silk Fabric Based on Four DFT Sector Features

著录项

• 来源
  《IEEE Conference on Information and Communication Technology》|2019年|1-7|共7页
• 会议地点 Allahabad(IN)
• 作者

  Shweta Loonkar; Dhirendra S. Mishra;

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• 作者单位

  NMIMS University MPSTME Computer Engineering Department Mumbai 56;

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• 会议组织
• 原文格式 PDF
• 正文语种
• 中图分类
• 关键词

  Fabrics; Classification algorithms; Training; Forestry; Feature extraction; Discrete Fourier transforms;

  机译：面料;分类算法;训练;林业;特征提取;离散傅立叶变换;