首页> 外文会议>Conference on infrared technology and applications >Scale down of p-n junction diodes of an uncooled IR-FPA for improvement of the sensitivity and thermal time response by 0.13-m CMOS technology
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Scale down of p-n junction diodes of an uncooled IR-FPA for improvement of the sensitivity and thermal time response by 0.13-m CMOS technology

机译:通过0.13-m CMOS技术改善了未加工IR-FPA的P-N结二极管的P-N结二极管,提高了灵敏度和热时间响应

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We have developed an uncooled infrared radiation focal plane array (IR-FPA) with 22 μm pitch and 320 × 240 pixels utilizing silicon p-n junction diodes, which were fabricated by 0.13 μm CMOS technology and bulk-micromachining. The thermal time response of cells was lowered to be 16msec by reduction of thermal capacity of cells. In addition to increase the sensitivity of cells by extending the length of supporting beams, p-n junction diode was scaled down as small as 20% in area compared to previous one. Micro-holes were formed in the cell to reduce only thermal capacity, which were negligibly small compared to incident IR wavelength. This method needs no additional process step and is considered as suitable for low cost and mass-productive IR-FPA.
机译:我们开发了一种具有22μm间距和320×240像素的加工红外辐射焦平面阵列(IR-FPA),利用硅P-N结二极管,由0.13μmCMOS技术和散装微机械制造。通过降低细胞的热量降低,细胞的热时间响应降低为16毫秒。除了通过延长支撑梁的长度来增加细胞的灵敏度,与前一个相比,P-N结二极管在面积中缩小为20%。在电池中形成微孔,仅减少与入射IR波长相比可忽略的热容量。该方法不需要额外的工艺步骤,并且被认为适用于低成本和质量生产的IR-FPA。

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