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An Investigation of the Removal of 1-Methyl-2-Pyrrolidinone (NMP)

机译:去除1-甲基-2-吡咯烷酮(NMP)的研究

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Molecular bases have long been known to be a problem in photolithographic applications using chemically amplified photoresists. Of these molecular bases, ammonia and 1-methyl-2-pyrrolidinone (NMP) have been studied in the most detail since chemical filtration of these contaminants is critical to the success of the photolithographic process. It has been well documented that ammonia is best removed through chemisorptive reactions using acid impregnated adsorbents or strong acid ion exchange resins. However, the mechanism(s) for the removal of NMP has not been investigated to any significant extent. There are several chemical filtration systems available that employ activated carbon, impregnated activated carbon, or ion exchange resins for the removal of NMP. This work investigates the removal of NMP using several different types of adsorbents and rationalizes the adsorption mechanism which is operative in each situation.
机译:已知分子碱已知使用化学扩增的光致抗蚀剂的光刻应用中的问题。在这些分子碱中,在最细节中已经研究了氨和1-甲基-2-吡咯烷酮(NMP),因为这些污染物的化学过滤对于光刻过程的成功至关重要。有充分的记录,通过使用酸浸渍的吸附剂或强酸离子交换树脂,通过化学检测反应最好地除去氨。然而,未在任何显着程度上研究用于去除NMP的机制。有几种可用的化学过滤系统,采用活性炭,浸渍的活性炭或离子交换树脂以除去NMP。该工作研究了使用几种不同类型的吸附剂去除NMP,并可合理化在每种情况下可操作的吸附机制。

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