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Defect structure and optical damage resistance of In:Er:LiTaO_3 crystals

机译:缺陷结构和光学损伤阻力:ER:LIAO_3晶体

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LiTaO_3 single crystals double-doped with 1.0 mol% Er~(3+) and various In~(3+) ions (In:Er:LiTaO_3) were grown by the Czochralski method from a congruent melt (C_(Li)/C_(Ta)=0.946). Ultraviolet-visible absorption spectra were measured and discussed in terms of the defect structure. Threshold concentration of In~(3+) ion is 3.0 mol%. Optical damage resistance of In:Er:LiTaO_3 crystals were characterized by the transmitted beam pattern distortion method. Optical damage resistance of In:Er:LiTaO_3 crystals significantly increases when the concentration of In~(3+) ion exceeds its threshold concentration. The optical damage resistance magnitude of In(3.0mol%):Er:LiTaO_3 crystal is two orders higher than that of Er:LiTaO_3 crystal. The optical damage resistance could be well understood in view of defect structure.
机译:LiTaO_3单晶双掺杂有1.0mol%ER〜(3+)和各种〜(3+)离子(IN:ER:LiTaO_3)从一致熔体中生长(C_(Li)/ C_( ta)= 0.946)。 测量紫外线可见吸收光谱并就缺陷结构讨论。 〜(3+)离子中的阈值浓度为3.0mol%。 光学损伤电阻:ER:LiTaO_3晶体的特征在于传输的光束图案失真方法。 当〜(3+)离子的浓度超过其阈值时,光学损伤电阻:ER:ER:LiTaO_3晶体显着增加。 荧光损伤电阻幅度(3.0mol%):ER:LiTaO_3晶体是比ER:LiaO_3晶体高的两个订单。 考虑到缺陷结构,可以很好地理解光学损伤阻力。

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