Electro-mechanical Durability of Pulsed-laser Deposited Indium Tin Oxide Thin Films on Polycarbonate Substrates for Flexible Electronic Devices

摘要

Uniaxial tensile electro-fragmentation tests has shown conductive failure with infinite resistance immediately following the crack onset strain (COS) of high quality 100 nm-thick indium tin oxide (ITO) films pulsed-laser deposited on polycarbonate (PC) flexible substrates. Two possible conductive failure mechanisms of ITO/PC systems are proposed. The results show that the conductive failure immediately following COS is due to poor adhesion between the two components where high elastic mismatch may accelerate the failure mechanism.