Study on Molecular Dynamics Simulation of Tungsten Microelectrode Based on Single Discharge in EDM

摘要

In this paper, in order to understand the mechanism of the microelectrode self-sharpening phenomenon in single discharge, molecular dynamics (MD) computer simulation is carried out. From the simulation result we find that during tungsten microelectrode self-sharpening process, single atom removing and bulk atom cluster removing both exist. Electric field force is a key factor for microelectrode shape forming. Heating rate (pulse duration) influences the shape of microelectrode largely, a optimum conditions in pulse duration and discharge current exist for microelectrode self-sharpening depending on the thermal conductivity and diameter of electrode.