A recently developed analytic technique that can correct for probe-position errors in planar near-field measurements to arbitrary accuracy, Muth and Lewis (1988, 1990), is shown to be also applicable to spherical near-field data after appropriate modifications. The method has been used successfully to remove probe-position errors in the planar near field, leading to more accurate far-field patterns, even if the maximum error in the probe's position is as large as 0.2 lambda . Only the error-contaminated near-field measurements and an accurate probe-position error function are needed to be able to implement the correction technique.
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