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A design study of TiO_2/n-Si energy band structure for charge carrier transportation in water splitting electrode

机译:水分裂电极电荷载流量的TiO_2 / N-Si能带结构的设计研究

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The present work aims to design a semiconductor system for an effective charger carrier separation and transportation process in a water splitting electrode. Therefore, a conduction band discontinuity between anatase phase titanium dioxide (A-TiO_2) and n-type silicon (n-Si) was investigated in this study. A-TiO_2 for the survey of a junction between TiO_2 and Si was deposited on an n-Si substrate via a spin-coating technique followed by a two-step annealing process. Three different n-type Si substrates with dopant density of 10~(15-16); 10~(17-18); 10~(20-21) cm~(-3) were used in this study. XRD and FE-SEM techniques were used for crystal phase and surface microstructure analysis. Electronic states of TiO_2 and n-Si for energy band evaluation was measured with XPS. Current-Voltage characteristics and dark-current were measured for a better understanding of charge carrier transfer in the TiO_2/n-Si junction.
机译:本工作旨在设计用于在水分离电极中的有效充电器载体分离和运输过程的半导体系统。 因此,在该研究中研究了锐钛矿相相二氧化钛(A-TiO_2)和N型硅(N-Si)之间的导带不连续性。 用于调查TiO_2和Si之间的连接的A-TiO_2通过旋涂技术沉积在N-Si衬底上,然后进行两步退火工艺。 具有掺杂剂密度为10〜(15-16)的三种不同的N型Si基材; 10〜(17-18); 在本研究中使用了10〜(20-21)厘米〜(3)。 XRD和Fe-SEM技术用于晶相和表面微观结构分析。 用XPS测量TiO_2和N-Si的电子状态。 测量电流 - 电压特性和暗电流,以更好地理解TiO_2 / N-Si结中的电荷载流子。

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