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A New Lifetime Prediction Method Based on Particulate Contaminants for Coaxial Connectors

机译:一种基于颗粒污染物的同轴连接器的新寿命预测方法

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The high concentration of dust particles in the environment is one of the main causes resulting for electrical contact failure of coaxial connectors. Therefore, it is important to carry out proper methods to predict life time of coaxial connectors. In the life time investigation of coaxial connectors, a model is designed and analyzed. Then conclusions are drawn based on a novel accelerated life test. In this paper, a life time prediction method is proposed based on an 1μm-diameter particle environment for the first time, and at the same time a kind of experiment operating equipment is designed to control the concentration of particles for accelerated testing. The result shows an exponential change in contact resistance of coaxial connectors under 1μm-diameter particle environment. We then establish Inverse Power Law-Weibull model for life time prediction in electrical contact failure and obtain the contact reliability and characteristic life.
机译:环境中的高浓度的灰尘颗粒是同轴连接器电接触失效导致的主要原因之一。 因此,重要的是要采用适当的方法来预测同轴连接器的寿命。 在同轴连接器的生命时间调查中,设计并分析了模型。 然后基于新型加速寿命测试来绘制结论。 本文首次基于1μm直径的粒子环境提出了一种寿命时间预测方法,同时设计了一种实验操作设备,用于控制用于加速测试的颗粒的浓度。 结果显示了在1μm直径粒子环境下同轴连接器的接触电阻的指数变化。 然后,我们为电接触失效的终生时间预测建立逆动力法 - 威布尔模型,并获得接触可靠性和特征寿命。

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