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Analysis of metastability performance in digital circuits on flip-flop

机译:触发器上数字电路中的常量性性能分析

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Metastability events are common in digital circuits, and synchronizers are necessary to protect us from their deadly effects. Originally synchronizers were necessary when playing an asynchronous input (that is, one synchronized with the clock input so that could change exactly when the sample). Everything changes can easily be metastable. Switch its data input at the same time that the sampling edge of the clock and you get Metastability. The two signals relative duration of each cycle varies a little, and eventually leading to the metastability, close enough to each other switches. This combination of metastability with normal display devices, occur frequently. Recent semiconducting metal oxide progress (CMOS) additionally leads to unprecedented levels of integration in digital logic systems. Due to the propagation delay of the path and timing clock hold time configuration errors failure occurs in digital circuits. Depending on the application, errors are described by number of deferent terms, including “synchronization failure error” and “Metastability error”. The underlying mechanism for all of these problems is the same, and these terms “Metastability error” is the largest, because it describes the failure of the element in the circuit and not to the application. The reference signal may be either a reference voltage on the base, for example a bias voltage or a reference based on the time, as a clock signal.
机译:亚稳性事件在数字电路中很常见,因此必须保护我们免受致命效果所必需的。最初的同步器是在播放异步输入时必需的(即,与时钟输入的同步,以便在样本时完全改变)。一切都可以很容易地融合。同时切换其数据输入,即时钟的采样边缘和获得常规性。每个循环的两个信号相对持续时间变化一点,最终导致衡量性,足够接近彼此开关。这种与正常显示设备的常规性的组合频繁发生。最近的半导体金属氧化物进度(CMOS)另外导致数字逻辑系统中前所未有的集成水平。由于路径的传播延迟和定时时钟保持时间配置错误发生在数字电路中发生故障。根据应用程序,误差由推迟术语数量描述,包括“同步故障错误”和“常量性错误”。所有这些问题的底层机制是相同的,这些术语“衡量性错误”是最大的,因为它描述了电路中元素的故障而不是应用程序。参考信号可以是基座上的参考电压,例如基于时间的偏置电压或参考,作为时钟信号。

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