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A compact SWIFTS spectrograph with a leaky loop structure

机译:一个紧凑的Swifts光谱仪,带有泄漏的环形结构

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This paper deals with a new spectrograph on integrated optics. It is composed of an Y-junction where the two junction arms are guided in a loop structure in order to obtain an interference pattern. The measurement of this intensity distribution gives access to the optical spectrum source after a Inverse Fourier Transform. To measure it, we use the property of the loop composed of a bent waveguide which is a leaky structure. Depending on the radius of the bent waveguide, a part of the light leaks from the waveguide to outside. The radiated power, proportional to the intensity in the waveguide, is coupled into a plan waveguide set near the bent waveguide. Indeed the two structures are separated by a gap which changes along the periphery of the loop. This structure enables both to control the leaking light part and to confine in the plan waveguide the propagation of the radiated field. Thereby, the radiated intensity is measured at a peculiar distance of the loop on a perpendicular plan to the input waveguide. So, the interference pattern measured is magnified by the ratio of the plan waveguide length over the loop radius, allowing to use a commercial photodetectors array to sufficiently sample the interference pattern. The spectrum is finally obtained operating a Discrete Fourier Transform. The device modelization is divided in two parts. The first part describes the coupling between the bent and the plan waveguide modelised by a modal method based on a Fourier series expansion (RCWA) combined with an exponential conformal mapping in order to simulate the electromagnetic field near the loop. The second part describes the Helmholtz-Kirchhoff theorem to simulate the far-electromagnetic field. From the interference pattern modelized, the spectrum of the signal is then calculated. A demonstrator in integrated optics on glass is being developed.
机译:本文涉及集成光学仪的新光谱仪。它由Y接合点组成,其中两个接合臂在环形结构中被引导,以获得干涉图案。在逆傅立叶变换之后,该强度分布的测量可以访问光谱源。为了测量它,我们使用由弯曲的波导组成的环路的性质,这是一种泄漏结构。取决于弯曲波导的半径,灯的一部分从波导泄漏到外部。与波导中的强度成比例的辐射功率耦合到弯曲波导附近的平面波导中。实际上,两个结构通过沿着环的周边改变的间隙分开。该结构使得能够控制泄漏光部分并限制在平面波导中的辐射场的传播。由此,辐射强度以垂直方案的垂直平面的奇迹距离测量到输入波导。因此,测量的干涉图案通过平面波导长度在环形半径上的比率而放大,允许使用商业光电探测器阵列充分地采样干扰图案。最终获得频谱操作离散傅里叶变换。设备建模化分为两部分。第一部分描述了由基于傅里叶串联扩展(RCWA)的模态方法建模的弯曲和平面波导之间的耦合与指数保形映射组合,以便模拟环附近的电磁场。第二部分描述了亥姆霍兹-Cherchhoff定理来模拟远电磁场。从干扰模式建模中,然后计算信号的频谱。正在开发玻璃集成光学中的示威者。

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