An efficient (well-conditioned) surface integral equation formulation is proposed for the scattering and radiation analysis of finite microstrip structures. The formulation on dielectric interface consists of weighted sums of the field integral equations corresponding to the external and internal dielectric regions with appropriate weighting coefficients. Discretization of the formulation by the moment method and the Galerkin's testing procedure can produce a matrix equation with good conditioning. Numerical results are presented to demonstrate the efficiency and accuracy of the proposed formulation.
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