This paper introduces a dual-projector phase measuring profiler that adds a second projector to a traditionalstructured light illumination system to improve the overall quality of 3D scanning. With this method, twoprojectors are synchronized to a single camera, but each one projects structured light patterns of a uniquefrequency. The system performance benefits from a wider projection angle and doubled light intensity. Inparticular, a detailed system implementation in hardware is described. Moreover, the major difference betweenthe phase unwrapping of our dual-projector system versus a single-projector system is discussed with a LUTbasedphase unwrapping scheme proposed.
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