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Monte Carlo-based tolerance study of an end-fed resonant slotted waveguide linear array antenna

机译:基于蒙特卡罗的终端谐振槽开槽波导线性阵列天线的公差研究

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This article presents a Monte Carlo-based analysis of the effects that random manufacturing errors produce on the radiation diagram of resonant slotted waveguide linear antennas. Positional and dimensional errors on the slots are considered. The study is performed using a tool implemented in MATLAB based on the Taylor synthesis of antenna parameters and the analysis of arrays and aperture models. The tool assesses the impact of the different errors on the radiation pattern. The results show that slot dimension errors have a dominant effect on the pattern over the variation on the slot position in the waveguide. A prototype of the studied antenna was build and its radiation pattern measured against the predicted mean and extreme tolerance margins. The results obtained are satisfactory, thus validating the implemented tool.
机译:本文提出了一种基于蒙特卡罗的基于乐曲的分析,其效果是随机制造错误在谐振开槽波导线性天线的辐射图上产生的效果。考虑插槽上的位置和尺寸误差。该研究是使用MATLAB中实现的工具进行的,基于天线参数的泰勒合成以及阵列和孔径模型的分析。该工具评估了不同误差对辐射模式的影响。结果表明,槽尺寸误差对波导中的槽位置的变化具有显着效果。研究的天线原型是构建的,并且其抗辐射图案测量到预测的平均值和极端容差距。获得的结果是令人满意的,从而验证实施的工具。

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