A Novel Integrated Testing Platform Based on Open VPX

摘要

With the development of high-speed and real-time signal processing systems toward modularization, generalization and reconstruction, a method of modular design has been proposed and accepted widely. However, the increasing module types and extending production scale make the module-test challenged and the test results of modules are dispersed, which make it difficult for collection and post-maintenance. Moreover, it's difficult to perform traversal test with so many module-combinations, and this consumes excess equipments and human resources. In this paper, we proposed a concept of integrated testing, and designed a integrated testing platform (ITP) based on the Open VPX architecture. The ITP can achieve intelligent identification and resources detection of the under-test single/multiple modules after startup, and with the users' manual configurations, the ITP can then perform the traversal test automatically. Besides, the ITP provides functions such as real-time fault alarm and the test report printing. The ITP has been applied in mass testing for an Open VPX-based high-performance processing module, with multiple VLSI (Very Large Scale Integrated) circuits integrated, such as TI TMS320C6678, Xilinx Virtex-6,etc, and greatly increases its efficiency and accuracy.