3D Measurement Using Circular Gratings

摘要

3D measurement using methods of structured light are well known in the industry. Most such systems use some variation of straight lines, either as simple lines or with some form of encoding. This geometry assumes the lines will be projected from one side and viewed from another to generate the profile information. But what about applications where a wide triangulation angle may not be practical, particularly at longer standoff distances. This paper explores the use of circular grating patterns projected from a center point to achieve 3D information. Originally suggested by John Caulfield around 1990, the method had some interesting potential, particularly if combined with alternate means of measurement from traditional triangulation including depth from focus methods. The possible advantages of a central reference point in the projected pattern may offer some different capabilities not as easily attained with a linear grating pattern. This paper will explore the pros and cons of the method and present some examples of possible applications.