Modeling of IR-Drop Induced Delay Fault in CNT and GNR Power Distribution Networks

摘要

The work in this paper analyses the delay fault in logic circuits due to power supply voltage drop (IR-Drop) in carbon nanotube (CNT) and graphene nanoribbon (GNR) interconnects for 16 nm technology node. The electrical equivalent model is used to derive the electrical circuit parameters for CNT and GNR interconnects. The results are compared with that of traditional copper (Cu) based interconnects. It has been found that the delay faults can be reduced using CNT and GNR power interconnects at longer lengths as compared to the traditional Cu based power interconnects.