Long-term-Storage Performance Degradation Causes of Fuse Electronic Components

摘要

The performance for fuse electronic components may have degradation after long-term-storage. In order to as-certain the components which its performance has degradation, two fuse electronic parts, which have been stored for 10 years, are chosen as samples for an accelerated test. It shows that the white noise from the resistance and the interfering noise between different resistances may lead the performance degradation. The zero drift due to the brokenness of bonding wire may magnify the noise voltage when under storage, and influence the reliability of the operational amplifier. The result indicates that the resistances and operational amplifiers should be concerned more when test fuse electronic device after a long storage.