首页> 外文会议>EOS conference on manufacturing of optical components >Measuring amplitude and phase of light emerging from microstructures with HRIM
【24h】

Measuring amplitude and phase of light emerging from microstructures with HRIM

机译:从HRIM中测量从微观结构出现的光的幅度和相

获取原文

摘要

Ultra high-resolution measurements of amplitude and phase field distributions emerging from a 1-μm-period amplitude grating are presented and discussed. In the axial direction periodically repeated features are found, whose origins are the Talbot effect within the Fresnel diffraction regime. Filtering diffraction orders in the back focal plane of the observing objective provides specific Talbot images and allows to intuitively understand the role of diffraction orders in this phenomenon.
机译:提出和讨论了从1μm周周期幅度光栅出现的幅度和相场分布的超高分辨率测量。在轴向方向上发现,找到了重复的特征,其起源是菲涅耳衍射制度内的塔图效应。在观察目标的后焦平面中过滤衍射顺序提供特定的Talbot图像,并允许直观地了解在这种现象中衍射令的作用。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号