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Optical tomography based on phase-shifting schlieren deflectometry

机译:基于相移Schlieren偏转测量的光学断层扫描

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We present a new optical tomography technique based on phase-shifting schlieren deflectometry. The principle is that of computerized tomography. The three-dimensional profile is reconstructed from the deflection angles of rays passing through the tested object. We have investigated optical phantoms chosen in view of the characterization of dendritic growth in a solidification process. Promising results have been obtained with a homogeneous sphere and a bundle of 200μm fibers. The deviation angles exceed two degrees with a variation of the refractive index Δn=0.025.
机译:我们提出了一种基于相移Schlieren偏转测量的新型光学断层扫描技术。原则是计算机层析术。从通过经过测试对象的光线的偏转角重建三维轮廓。考虑到在凝固过程中表征树枝状生长的表征,我们已经研究了研究了光学幻影。已经用均匀的球体和一束200μm纤维获得了有希望的结果。偏差角度超过两度,折射率Δn= 0.025的变化。

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