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The dielectric tunability of Ba_(0.6)Sr_(0.4)TiO_3 thin films deposited by radio-frequency magnetron sputtering

机译:通过射频磁控溅射沉积的BA_(0.6)SR_(0.4)SR_(0.4)TiO_3薄膜的介电可调性

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Ba_(0.6)Sr_(0.4)TiO_3 (BST) thin films with the thickness of 300nm were deposited on P1/SiO_2/Si substrates at various deposition temperatures by RF magnetron sputtering technique, and their electric properties were investigated. Due to the high temperature annealing process at substrate temperature of 600 °C, well-crystallized BST film was deposited. The dielectric constant and dielectric loss of the film deposited at 600 °C are 300 and 0.033 at 100 kHz, respectively. Due to the good crystallinity of the BST films deposited by RF magnetron sputtering, high dielectric tunability up to 39.2% is achieved at a low applied voltage of 5V.
机译:Ba_(0.6)Sr_(0.4)TiO_3(BST)厚度为300nm的薄膜在通过RF磁控溅射技术的各种沉积温度下沉积在P1 / SiO_2 / Si基板上,并研究了它们的电性能。由于底物温度为600℃的高温退火过程,沉积了良好结晶的BST薄膜。在600℃下沉积在600℃的膜的介电常数和介电损耗分别为300和0.033,以100kHz。由于RF磁控溅射沉积的BST薄膜的良好结晶度,在5V的低施加电压下实现高达39.2%的高介电可调性。

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