首页> 外文会议>International Visual Informatics Conference >High Order Polynomial Surface Fitting for Measuring Roughness of Psoriasis Lesion
【24h】

High Order Polynomial Surface Fitting for Measuring Roughness of Psoriasis Lesion

机译:高阶多项式表面配件,用于测量牛皮癣病变的粗糙度

获取原文

摘要

Scaliness of psoriasis lesions is one of the parameters to be determined during Psoriasis Area and Severity Index (PASI) scoring. Dermatologists typically use their visual and tactile senses to assess PASI scaliness. However, it is known that the scores are subjective resulting in inter- and intra-rater variability. In this paper, an objective 3D imaging method is proposed to assess PASI scaliness parameter of psoriasis lesions. As scales on the lesion invariably causes roughness, a surface-roughness measurement method is proposed for 3D curved surfaces. The method applies a polynomial surface fitting to the lesion surface to extract the estimated waviness from the actual lesion surface. Surface roughness is measured from the vertical deviations of the lesion surface from the estimated waviness surface. The surface roughness algorithm has been validated against 328 lesion models of known roughness on a medical mannequin. The proposed algorithm is found to have an error 0.0013 ± 0.0022 mm giving an accuracy of 89.30%. The algorithm is invariant to rotation of the measured surface. Accuracy of the rotated lesion models is found to be greater than 95%. System repeatability has been evaluated to successive measurements of 456 psoriasis lesions. The system repeatability can be accepted since 95.27% of the measurement differences are less than two standard deviation of measurement difference.
机译:牛皮癣病变的缩放是在牛皮癣区域和严重程度指数(PASI)评分期间要确定的参数之一。皮肤科医生通常使用他们的视觉和触觉感官来评估PASI溶度。然而,众所周知,得分是主观导致帧内帧内变异性。本文提出了一种目标3D成像方法来评估牛皮癣病变的PASI粘度参数。随着病变的鳞片总是导致粗糙度,提出了一种用于3D弯曲表面的表面粗糙度测量方法。该方法将多项式表面施加到病变表面上以从实际病变表面提取估计的波纹。从病变表面的垂直偏差从估计的波感表面测量表面粗糙度。表面粗糙度算法已针对医疗时装模特的已知粗糙度的328个病变模型进行了验证。发现该算法的误差具有0.0013±0.0022mm,其精度为89.30%。该算法不变于测量表面的旋转。发现旋转病变模型的准确性大于95%。系统可重复性已被评估为逐次测量456个牛皮癣病变。由于95.27%的测量差异的测量差异小于测量差异的两个标准偏差,因此可以接受系统重复性。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号