【24h】

Measurement system for photodetector characterization

机译:光电探测器表征的测量系统

获取原文

摘要

A measurement system for electro-optical characterization of photodetectors and photodetector arrays is presented. The system is intended for laboratory use where typically a few devices are characterized at a time. The instrument is designed for determining the photoresponse (dc and pulse) of a single photodetector or a photodetector array as a function of wavelength, position, and temperature. In case of photodetector arrays, the measurement of modulation transfer function (MTF) and fast determination of its photoresponse nonuniformity (PRNU) is also possible. The instrument setup and experimental results are presented.
机译:提出了一种用于光电探测器和光电探测器阵列的电光表征的测量系统。该系统旨在用于实验室使用,其中通常是几个器件的特征在于。该仪器设计用于确定单个光电探测器的光响应(DC和脉冲)或光电探测器阵列作为波长,位置和温度的函数。在光电探测器阵列的情况下,还可以测量调制传递函数(MTF)和快速测定其光源不均匀性(PRNU)。介绍了仪器设置和实验结果。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号