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3D image reconstruction using optical sectioning in confocal scanning microscopy

机译:使用光学切片在共聚焦扫描显微镜中的3D图像重建

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Confocal scanning microscopy (CSM) has been used in biological application, materials science, semiconductor quality measurement and other non-destructive microscopic application. Small spot of light illuminates a sample, and a small detector that is ideally a point detector collects the reflected or transmitted light having the information of specimen. An image distribution can be reconstructed by a correlation analysis of spots with the high bandwidth. The mechanism for two-dimensional beam scanning and optical sectioning has an important role in CSM as the three-dimensional profiler. The parasitic motion of focus on the detector gives rise to the fatal distortion of an image profile named the extinction effect while using acousto-optical (AO) deflector. We propose the progressive methods for the high quality image as the following. At first, for having the corrected image, small spot and long scan range, this paper shows that the optimal design having the multi-objects can be used by choosing the unitary lens device in CSM. At second, in order to compensate for the intensity cancellation at the end profile that may be the cause of waviness for the optical image, this paper shows that it is efficient to schedule the frequency of scan. According to characteristics of the extinction curve and axial/lateral response having the error property, we can define the frequency and sensitivity of as their robustness. Finally, the axial response gives an important motive for the optical section, and the limit of object depth. The edge enhancement may be a fatal defeat to the reconstruction of image and sensitive to the conditions of specimen such as slope, irregular reflectivity, shape, etc. That means that the intensity profile for the open loop scanning method should be matched with its response to a perfect mirror as specimen, which can be minimized with the optical sectioning or the optical probe of the closed loop control.
机译:共聚焦扫描显微镜(CSM)已用于生物应用,材料科学,半导体质量测量等无损微观应用。小光斑照射样品,并且一个是理想的小检测器,其是点检测器收集具有样本信息的反射或透射光。可以通过具有高带宽的斑点的相关分析来重建图像分布。二维光束扫描和光学切片的机制在CSM中具有重要作用,作为三维分析仪。聚焦对检测器的寄生运动导致在使用声光(AO)偏转器的同时引起命名消光效果的图像曲线的致命失真。我们为以下提出了高质量图像的渐进方法。首先,对于具有校正的图像,小点和长扫描范围,本文可以通过在CSM中选择单一镜头装置来使用具有多物体的最佳设计。在第二个中,为了补偿可能是光学图像的波纹的原因的最终轮廓的强度取消,本文表明,调度扫描频率是有效的。根据具有误差性的消光曲线和轴向/横向响应的特征,我们可以定义其鲁棒性的频率和灵敏度。最后,轴向响应给出了光学部分的重要动机,以及物体深度的极限。边缘增强可能是对图像重建的致命失败,并且对样本的条件敏感,例如坡度,不规则反射率,形状等。这意味着开环扫描方法的强度曲线应与其对其的响应相匹配作为样品的完美镜子,可以用闭环控制的光学切片或光学探头最小化。

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