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EVALUATION OF TWO NON-STANDARD TECHNIQUES FOR THE PHASE NOISE CHARACTERIZATION AT MICROWAVE FREQUENCIES

机译:对微波频率相位噪声表征的两个非标准技术的评估

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摘要

Two different phase noise measurement techniques dedicated to the test of microwave free running oscillators are described and compared. The interest of an injection locking technique for the character.zation of the close to carrier performance of Iow phase noise DRO is shown through different measurements examples on state-of-the-art DRO at C and X band.
机译:描述并比较了专用于微波运行振荡器测试的两种不同的相位噪声测量技术。通过在C和X频带上的最新DRO上的不同测量示例,示出了注射锁定技术的兴趣对IOW相位噪声DRO的接近载波性能。

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